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Chip Carrier Based Systems and their Testability

C. Maunder (British Telecom Research Laboratories, Ipswich, Suffolk, England)
D. Roberts (British Telecom Research Laboratories, Ipswich, Suffolk, England)
N. Sinnadurai (British Telecom Research Laboratories, Ipswich, Suffolk, England)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 February 1984

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Abstract

Testing has become one of the dominant costs in the process of bringing a product from initial conception to the market place. Because of this, it is now imperative that the impact of any technology change on the test process is considered at an early stage. In this light, the increasing trend towards the use of surface‐mounting techniques in the fabrication of electronic systems is examined, with particular emphasis on the consequences on product testing during design validation, manufacture and repair. The aim is to highlight areas in which new attitudes and replacements for traditional solutions will be needed if surface‐mounting techniques are to be as cost‐effective as possible.

Citation

Maunder, C., Roberts, D. and Sinnadurai, N. (1984), "Chip Carrier Based Systems and their Testability", Microelectronics International, Vol. 2 No. 1, pp. 29-36. https://doi.org/10.1108/eb044159

Publisher

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MCB UP Ltd

Copyright © 1984, MCB UP Limited

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