Designing for Testability
G.W. Jacob
(ITT Europe Inc., Advanced Manufacturing Technology Center, Brussels, Belgium)
26
Abstract
Semiconductor devices and systems containing them have become so complex that it is difficult and costly to test them adequately. The solution is to design them to be testable. In this the author considers testability cost trade‐offs, outlines the interrelationship of test programming and designing for testability, and presents several methods of designing for testability.
Citation
Jacob, G.W. (1984), "Designing for Testability", Microelectronics International, Vol. 2 No. 1, pp. 21-24. https://doi.org/10.1108/eb044157
Publisher
:MCB UP Ltd
Copyright © 1984, MCB UP Limited