Reliability and Quality Assurance Basic Concepts and Their Application to Microcircuits

Abstract

An understanding of reliability physics, failure analysis and failure mechanisms as applied to semiconductor technologies is essential in assessing microcircuit reliability. The use of valid thermal accelerated tests and the correct use of the data therefrom is crucial in assessing reliability. Improved technical data are required from most manufacturers if user analysis of accelerated testing is to be more easily and accurately carried out.

Citation

George, A.H. (1984), "Reliability and Quality Assurance Basic Concepts and Their Application to Microcircuits", Microelectronics International, Vol. 2 No. 1, pp. 12-14. https://doi.org/10.1108/eb044154