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Overview of Tape Automated Bonding Technology

J.H. Lau (Hewlett‐Packard Company, Palo Alto, California, USA)
S.J. Erasmus (Hewlett‐Packard Company, Palo Alto, California, USA)
D.W. Rice (Hewlett‐Packard Company, Palo Alto, California, USA)

Circuit World

ISSN: 0305-6120

Article publication date: 1 January 1990



A review of state‐of‐the‐art technology pertinent to tape automated bonding (for fine pitch, high I/O, high performance, high yield, high volume and high reliability) is presented. Emphasis is placed on a new understanding of the key elements (for example, tapes, bumps, inner lead bonding, testing and burn‐in on tape‐with‐chip, encapsulation, outer lead bonding, thermal management, reliability and rework) of this rapidly moving technology.


Lau, J.H., Erasmus, S.J. and Rice, D.W. (1990), "Overview of Tape Automated Bonding Technology", Circuit World, Vol. 16 No. 2, pp. 5-24.




Copyright © 1990, MCB UP Limited

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