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COMPARISON OF DIRECT DIFFERENTIATION AND ADJOINT VARIABLE METHOD FOR ELECTRICAL IMPEDANCE IMAGING

S.‐Y. HAHN (Departments of Electrical Engineering, Seoul National University, Seoul 151–742, and Kangweon National University, Chuncheon 200–701, Korea, and Technical University of Warsaw, 00–661 Warsaw, Koszykowa 75, Poland)
I.‐H. PARK (Departments of Electrical Engineering, Seoul National University, Seoul 151–742, and Kangweon National University, Chuncheon 200–701, Korea, and Technical University of Warsaw, 00–661 Warsaw, Koszykowa 75, Poland)
H.‐K. JUNG (Departments of Electrical Engineering, Seoul National University, Seoul 151–742, and Kangweon National University, Chuncheon 200–701, Korea, and Technical University of Warsaw, 00–661 Warsaw, Koszykowa 75, Poland)
J. SIKORA (Departments of Electrical Engineering, Seoul National University, Seoul 151–742, and Kangweon National University, Chuncheon 200–701, Korea, and Technical University of Warsaw, 00–661 Warsaw, Koszykowa 75, Poland)

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN: 0332-1649

Article publication date: 1 January 1993

99

Abstract

In the shadow of X‐ray tomography and nuclear magnetic resonance tomography a new tomographic technique based on low‐frequency electric currents has been successfully developed in the past decade. Impedance computed tomography (ICT), although it gives poor spatial resolution images, is unmatched in certain cases. Two different approaches to the sensitivity analysis are presented in this paper. The direct differentiation method has been applied, but the adjoint variable method has not been used in ICT reconstruction algorithms until now. Some problems associated with the adjoint variable method of sensitivity analysis are discussed. The new algorithm is compared with the direct differentiation approach.

Citation

HAHN, S.‐., PARK, I.‐., JUNG, H.‐. and SIKORA, J. (1993), "COMPARISON OF DIRECT DIFFERENTIATION AND ADJOINT VARIABLE METHOD FOR ELECTRICAL IMPEDANCE IMAGING", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 12 No. 1, pp. 21-34. https://doi.org/10.1108/eb010332

Publisher

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MCB UP Ltd

Copyright © 1993, MCB UP Limited

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