Scanning electron microscope is portable

Anti-Corrosion Methods and Materials

ISSN: 0003-5599

Article publication date: 23 May 2008

Citation

(2008), "Scanning electron microscope is portable", Anti-Corrosion Methods and Materials, Vol. 55 No. 3. https://doi.org/10.1108/acmm.2008.12855cab.002

Publisher

:

Emerald Group Publishing Limited

Copyright © 2008, Emerald Group Publishing Limited


Scanning electron microscope is portable

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Scanning electron microscope is portable

Article Type: Methods From: Anti-Corrosion Methods and Materials, Volume 55, Issue 3.

Jeol USA introduces a new mobile scanning electron microscope that can travel or easily be moved to different locations as needed. In the research or manufacturing setting, the CarryScope (Figure 1) can be transported between the lab, conference room, or office for inspection of products or analysis of research samples.

Figure 1 Not exactly pocket-sized: the JCM 5700 CarryScope from Jeol

The Jeol CarryScope delivers several high-resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.

Standard features include 8× to 300,000× imaging and up to 5.0nm resolution. The CarryScope produces a sharp image that makes it possible to conduct and annotate high-precision measurements on sub-micron structures. The optional eucentric motorised specimen stage holds a specimen up to 150mm in diameter.

Other options include low vacuum, EDS compatibility, and multiple live image display, including picture in picture. A stage navigation system and SmileShot software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM.

More information is available from www.jeolusa.com