TY  - JOUR
AB  - 
VL  - 51
IS  - 6
SN  - 0003-5599
DO  - 10.1108/acmm.2004.12851fab.003
UR  - https://doi.org/10.1108/acmm.2004.12851fab.003
PY  - 2004
Y1  - 2004/01/01
TI  - Zeiss SIRFs evanescent wave microscopy – Carl Zeiss launches total internal reflection microscopy system designed to meet the budgets of individual scientists
T2  - Anti-Corrosion Methods and Materials
PB  - Emerald Group Publishing Limited
Y2  - 2024/09/23
ER  -