Zeiss SIRFs evanescent wave microscopy – Carl Zeiss launches total internal reflection microscopy system designed to meet the budgets of individual scientists

Anti-Corrosion Methods and Materials

ISSN: 0003-5599

Publication date: 1 December 2004

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Citation

(2004), "Zeiss SIRFs evanescent wave microscopy – Carl Zeiss launches total internal reflection microscopy system designed to meet the budgets of individual scientists", Anti-Corrosion Methods and Materials, Vol. 51 No. 6. https://doi.org/10.1108/acmm.2004.12851fab.003

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Emerald Group Publishing Limited

Copyright © 2004, Emerald Group Publishing Limited

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