Patent abstracts

Citation

(2009), "Patent abstracts", Assembly Automation, Vol. 29 No. 2. https://doi.org/10.1108/aa.2009.03329bad.004

Patent abstracts

Article Type: Patent abstracts From: Assembly Automation, Volume 29, Issue 2

Title: Embedded inspection image archival for electronics assembly machinesApplicant: Cyberoptics Corp. (US); Fishbaine David (US); Case Steven K. (US)Patent number: WO2007139716Publication date: December 6, 2007

Abstract: A pick and place machine includes a vision system for acquiring at least one image relative to at least one component-related operation within the pick and place machine. The at least one image is stored along with one or more trace keys associated with the component-related operation. A database of images and associated trace keys can then be used to analyze operation of the pick and place machine to identify aspects that are out of control, or threaten to be out of control.

Title: Method and apparatus for automatic measurement of pad geometry and inspection thereofApplicant: Cognex Technology and Invest C (US)Patent number: US7171036Publication date: January 30, 2007

Abstract: An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.

Title: Embedding items with RFID tags for tracking and calibrationApplicant: Tagent Corp.Patent number: WO2008133613 (US)Publication date: November 6, 2008

Abstract: RFID tags of very small size are embedded in products or composed of products in a manufacturing process. The system employs different read and write modes to enable auto-tracking of material, some assembly, assembly and component items through various stages of the manufacturing process. As each item passes special predetermined points in the manufacturing process, the embedded tag is activated and placed in track mode. The tag transmits its ID and a track count representing the number of stations passed. The tag’s track count is incremented and the updated track count is stored in non-volatile memory in the tag. The tags can be programmed so that once the count exceeds a predetermined count, a status bit is set in the tag7’s memory indicating that the item has been completely through the manufacturing process. Thus, the system can determine whether an item or product has been completed. After manufacture the same RFID tag can be used for tracking, inventory and item authentication.

Title: 3D assembly verification from 2D imagesApplicant: Cognex Technology and Invest C (US); Michael David J. (US); Wallack Aaron S. (US)Patent number: WO2008147355Publication date: December 4, 2008

Abstract: A method and apparatus for assembly verification is disclosed. A measurement of the 3D position of each subcomponent is performed using triangulation from three cameras acquiring images simultaneously. An operator trains one 2D model, correspond to the same subcomponent of the assembly, per camera. At run-time, models are registered in each camera view so as to provide measured 3D position of the subcomponents. Then, measured 3D positions are compared with expected nominal 3D positions, and differences in 3D position are checked against tolerances. The invention simplifies the task of assembly verification, requiring only multiple cameras fixed above an assembly line. After minor operator activity, the invention can then perform assembly verification automatically. Since the invention can perform fixtureless assembly verification, a part can be presented to the machine vision system with arbitrary 3D position and orientation. Stroboscopic illumination can be used to illuminate parts on a rapidly moving assembly line.

Title: Method and apparatus for vehicle service system optical target assemblyApplicant: Hunter Eng Co (US)Patent number: US2008271328Publication date: November 6, 2008

Abstract: A machine vision vehicle wheel alignment system optical target assembly incorporating an adaptor for attachment of an optical target to a vehicle wheel assembly. The adaptor includes at least three contact points for abutment against surfaces of a vehicle wheel assembly, and an attachment mechanism configured to grip surfaces of a tire mounted to the wheel rim to hold the optical target assembly in contact with the wheel assembly surface. The optical target is secured to the adaptor, and maintained in a fixed relationship to the wheel assembly thereby during a vehicle wheel alignment measurement procedure.

Title: IC test sorting machineApplicant: Hon Technologies Inc. (TW)Patent number: TW283649Publication date: July 11, 2007

Abstract: A kind of IC test sorting machine, in which the material-inputting apparatus with the guiding mechanism is used to carry and correct the material-tray that carries the IC to be tested so as to make the material-moving apparatus capable of accurately picking the IC to be tested. For each material-picking mechanism of the material-moving apparatus, the second directional movement structure having the picking implement is installed in a suspending manner below the first directional movement structure so as to save the device arrangement space and have the capability of shrinking machine volume. At first, the material-moving apparatus uses the picking implement to move the IC to be tested to a heating apparatus where the IC to be tested is heated. Then, the IC to be tested is moved to a carrying apparatus, which moves the IC to be tested inside a hot testing room having good airtight characteristic such that the IC to be tested is located at one side of the testing stage. After that, the vision apparatus installed outside the hot testing room is capable of scanning to check if there is any foreign matter inside the testing stage. Then, the inspecting apparatus, which is installed outside the hot testing room, uses the picking implement to move the IC to be tested of the carrying apparatus to the testing stage to perform the inspecting operation. After the inspection is completed, the measurement-finished IC is placed on the carrying apparatus and is moved outside the hot testing room such that the material-moving apparatus can move out the measurement-finished IC to the material outputting position. In addition, the measurement-completed IC is sorted and placed according to the testing results so as to reach the purpose of greatly increasing the application benefit.

Title: Machine element control apparatus using RFID tag and machine element control using the sameApplicant: Hitachi Ltd (JP)Patent number: EP1986134Publication date: October 29, 2008

Abstract: In a machine element control method, when conducting maintenance and inspection of a machine element assembly such as a plant to be operated for a long period of time exceeding life of RFID tags, to enable use of the RFID tags to identify respective machine elements, new RFID tags are additionally attached and a correspondence with respect to the RFID tags are stored and verified.