CitationDownload as .RIS
Emerald Group Publishing Limited
Copyright © 2005, Emerald Group Publishing Limited
Keywords: Machine vision, Inspection, Image processing
Title: Common reference target machine vision wheel alignment systemApplicant: Dorrance Daniel R (US); Strege Timothy A (US); Burns Leigh R (US); Shylanski Mark S (US); Golab Thomas J (US)Patent number: US2005078304Publication date: 14 April 2005
A camera configuration for a machine vision vehicle wheel alignment system which does not dispose all of the cameras on a single rigid structure, such that cameras disposed to view the left side of a vehicle are movable independently of the cameras disposed to view the right side of the vehicle, while maintaining a common reference coordinate system for determining vehicle wheel alignment angles.
Title: Machine vision inspection systemand methodApplicant: Mitutoyo Corp. (JP)Patent number: EP1475627Publication date: 10 November 2004
A precision machine vision inspection system and method for increased inspection throughput. The vision inspection system includes a movable stage for scanning and measuring selected workpiece features. In prior systems, conventional interspersing of image processing and inspection operations with image acquisition operations required stopping and starting the stage motion during image acquisition, necessitating associated delays or wait-states in various operations. Such delays are avoided in this invention by acquiring images continuously, with a timing that is independent of image inspection operations, so that delays and wait- states are avoided. In addition, continuous stage motion is combined with a strobe lighting feature during the image acquisition operations to acquire blur-free images at a high rate. Improved image acquisition and image analysis routines including these features are created and stored by the system.
Title: Automated defect classification system and methodApplicant: Peles Netanel (IL); Moran Maty (IL); Zohar Zeev (IL)Patent number: US2005075841Publication date: 7 April 2005
A system and method for automatic defect classification is provided including at least one tool handler to receive a defect result file and at least one image file from a remote defect inspection tool, a process controller to create a data set from the defect result file and at least one image file, a database including a set of automated defect classification system (CADC) session data that includes data related to the data set, and a classification engine to automatically classify defects in the data set. A system and method for an automated monitoring system is provided including a production automatic defect classification (ADC) system, a monitoring CADC, and a monitor process to compare the defect result files of the production ADC system and said monitoring CADC.
Title: Patterned illumination method and apparatus for machine vision systemsApplicant: Pressco Tech Inc. (US); Cochran Don W (US); Cech Steven D (US); Palombo Thomas H (US); Yoder Michael L (US); Booher Jesse (US); Graves Terry L (US)Patent number: WO2004001285Publication date: 31 December 2003
This application relates to an apparatus and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators to enable visual surface inspection of polished objects such as ball bearings. The use of patterned illuminators properly disposed in relation to a polished part under inspection allows small surface imperfections such as scratches and pits to become visible against the normal surface background. The use of carefully engineered illuminators facilitates advantageous defect-site scattering from generally dark field sources. The patterned nature of the illuminators defined by this invention allows the complete surface of three-dimensional parts to be effectively highlighted using dark field illumination fields.
Title: Object three-dimensional model quick obtaining method based on active visionApplicant: Automation Inst CAS (CN)Patent number: CN1512455Publication date: 14 July 2004
The process of obtaining 3D model of object quickly based on active vision includes calibrating the light planar equation of the grating planes of the projector under reference coordinate system and the projecting transformation matrix from the reference coordinate system to the camera; taking one frame of object picture with grating and one frame with grains only; inputting the images into computer; extracting the edges of grating from the image automatically or via man-machine interaction and clustering; finding out the 3D coordinates of all the grating edge points of object in the reference coordinate system via reverse projection to obtain the 3D model of the visible object surfaces; performing triangular decomposition of 3D points on object surface and mapping the grain information onto the 3D model; rotating the object in certain angle before repeating the said steps to obtain one other 3D model of other side; and data fusion to obtain complete 3D model of the object.