Influence of mechanical exposures on electrical properties of thin and thick-film flexible resistors and conductors

Abstract

Purpose

The purpose of this paper is to determine the influence of mechanical factors (such as longitudinal elongation or cyclic compressive and tensile stresses) on electrical properties of thin- or thick-film resistors or conductors.

Design/methodology/approach

All test samples were made on Kapton foil. Copper foil or silver-based polymer thick-film conductive inks were used for fabrication of conductors. Resistive structures were made with the aid of two polymer thick-film resistive inks or OhmegaPly Ni-P resistive foil. Test structures differ not only in materials applied for resistors or conductors but also in geometrical shape of functional tracks (meanders consisted of many horse-shoes, semicircles, squares or triangles).

Findings

Presented results showed significant role of material on range of reversible resistance changes. But shape of test samples also affects relation between relative resistance changes and relative elongation.

Originality/value

In general, changes induced by cyclic compressive and stretching stresses were smaller than those caused by substrate elongation.

Citation

Osypiuk, P., Dziedzic, A. and Stęplewski, W. (2016), "Influence of mechanical exposures on electrical properties of thin and thick-film flexible resistors and conductors", Soldering & Surface Mount Technology, Vol. 28 No. 1, pp. 33-38. https://doi.org/10.1108/SSMT-10-2015-0035