To read this content please select one of the options below:

Study of IMC at interfaces of Sn3.0Ag0.5Cu3.0Bi0.05Cr/Cu joints during thermal ageing

Guokui Ju (School of Materials Science and Engineering, Shanghai University, Shanghai, China)
Fei Lin (School of Materials Science and Engineering, Shanghai University, Shanghai, China)
Wenzhen Bi (School of Materials Science and Engineering, Shanghai University, Shanghai, China)
Yongjiu Han (School of Materials Science and Engineering, Shanghai University, Shanghai, China)
Wang Junjie (School of Materials Science and Engineering, Shanghai University, Shanghai, China)
Xicheng Wei (School of Materials Science and Engineering, Shanghai University, Shanghai, China)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 26 August 2014

169

Abstract

Purpose

The purpose of this study was to comparatively investigate interfacial intermetallic compounds (IMCs) in the Sn3.0Ag0.5Cu3.0Bi0.05Cr/Cu (SACBC/Cu) and Sn3.0Ag0.5Cu/Cu (SAC/Cu) solder joints, and to determine any differences.

Design/methodology/approach

The samples were annealed after isothermal ageing at 150°C for 0, 168 and 500 hours, and their cross-sections were observed by scanning electron microscopy and energy dispersive spectroscopy.

Findings

The interfacial IMC morphology in two joints had significant differences. For the Cu/SAC/Cu joints, the granular and short rod-like Ag3Sn particles attached on the surface and boundary of interfacial Cu6Sn5 grains were detected, and they coarsened observably with ageing time at 150°C, and lastly embedded at the grain boundaries. However, for the Cu/SACBC/Cu joints, there were tiny filamentous Ag3Sn growing on the surface of interfacial Cu6Sn5 grains, and the Ag3Sn had a tendency to break into nanoparticles, which would be distributed evenly and cover the IMC layer, profiting from the Bi and Cr precipitates from solder matrix during ageing.

Originality/value

The paper implies that the addition of Bi and Cr could affect the IMCs of joints, thereby delaying interfacial reactions between Sn and Cu atoms and improving the service reliability. The SACBC solder is a potential alloy for electronic packaging production.

Keywords

Citation

Ju, G., Lin, F., Bi, W., Han, Y., Junjie, W. and Wei, X. (2014), "Study of IMC at interfaces of Sn3.0Ag0.5Cu3.0Bi0.05Cr/Cu joints during thermal ageing", Soldering & Surface Mount Technology, Vol. 26 No. 4, pp. 173-179. https://doi.org/10.1108/SSMT-08-2013-0022

Publisher

:

Emerald Group Publishing Limited

Copyright © 2014, Emerald Group Publishing Limited

Related articles