Correlation of microstructural evolution and hardness properties of 99.0Sn-0.3Ag-0.7Cu (SAC0307) lead-free solder under blast wave condition
Soldering & Surface Mount Technology
ISSN: 0954-0911
Article publication date: 2 April 2019
Issue publication date: 16 April 2019
Abstract
Purpose
The purpose of this paper is to discuss the effect of a blast wave on the microstructure, intermetallic layers and hardness properties of Sn0.3Ag0.7Cu (SAC0307) lead-free solder.
Design/methodology/approach
Soldered samples were exposed to the blast wave by using trinitrotoluene (TNT) explosive. Microstructure and intermetallic layer thickness were identified using Alicona ® Infinite Focus Measurement software. Hardness properties of investigated solders were determined using a nanoindentation approach.
Findings
Microstructure and intermetallic layers changed under blast wave condition. Hardness properties of exposed solders decreased with an increase in the TNT explosive weight.
Originality/value
Microstructural evolution and mechanical properties of the exposed solder to the blast wave provide a fundamental understanding on how blast waves can affect the reliability of a solder joint, especially for military applications.
Keywords
Acknowledgements
The authors gratefully acknowledge the financial supported by the Fundamental Research Grant Scheme (Grant. No. FRGS/1/2015/SG06/UPNM/03/1) provided by the Ministry of Higher Education of Malaysia, Universiti Pertahanan Nasional Malaysia (UPNM), Universiti Kebangsaan Malaysia (UKM) and Redring Solder (M) Sdn. Bhd. for research materials and collaboration work.
Citation
Wan Yusoff, W.Y., Ismail, N., Safee, N.S., Ismail, A., Jalar, A. and Abu Bakar, M. (2019), "Correlation of microstructural evolution and hardness properties of 99.0Sn-0.3Ag-0.7Cu (SAC0307) lead-free solder under blast wave condition", Soldering & Surface Mount Technology, Vol. 31 No. 2, pp. 102-108. https://doi.org/10.1108/SSMT-06-2018-0019
Publisher
:Emerald Publishing Limited
Copyright © 2019, Emerald Publishing Limited