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Effect of isothermal storage on the microstructure and grain orientation of Cu/Cu3Sn/Cu solder joint

Gangli Yang (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Xiaoyan Li (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Xu Han (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Shanshan Li (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 31 May 2022

Issue publication date: 6 January 2023

125

Abstract

Purpose

This study aims to analyse the changes in the microstructure and grain orientation of the full Cu3Sn solder joint (Cu/Cu3Sn/Cu) during isothermal aging at 420°C.

Design/methodology/approach

The Cu3Sn solder joint was fabricated through soldering Cu/Sn/Cu structure and then aged at 420°C. The microstructure evolution and grain orientation were studied by observing the cross-section and top-view surfaces of solder joints.

Findings

Original Cu3Sn solder joint initially transformed into the full Cu41Sn11solder joint (Cu/Cu41Sn11/Cu) at 10 h and finally into the full α(Cu) solder joint (Cu/α(Cu)/Cu) at 150 h during aging. Micro-voids formed in the center of the solder joint interface during the conversion of Cu41Sn11to α(Cu), resulting in lower reliability of the solder joint. Cu3Sn and Cu41Sn11 grains presented a column-like shape, while α(Cu) presented an irregular shape. The average grain sizes of interfacial phases first increased and then decreased during aging. Original Cu3Sn solder joint exhibited two main textures: [100]//TD and [203]//TD. For Cu41Sn11, the preferred orientation of [111]//TD was found in the early nucleation stage, while the orientation of the formed full Cu41Sn11 solder joint was dispersed. Furthermore, α(Cu) grains exhibited {100}<100> preferred orientation.

Originality/value

Few researchers focused on the process of microstructure and grain orientation changes during high-temperature (> 300°C) aging of Cu3Sn solder joint. To bridge the research gap, a high-temperature aging experiment was conducted on Cu3Sn solder joints.

Keywords

Acknowledgements

This work was supported by the National Natural Science Foundation of China [Grant No. 51975013].

Citation

Yang, G., Li, X., Han, X. and Li, S. (2023), "Effect of isothermal storage on the microstructure and grain orientation of Cu/Cu3Sn/Cu solder joint", Soldering & Surface Mount Technology, Vol. 35 No. 1, pp. 44-50. https://doi.org/10.1108/SSMT-04-2022-0034

Publisher

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Emerald Publishing Limited

Copyright © 2022, Emerald Publishing Limited

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