Influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) technology

Abstract

Purpose

The purpose of this paper is to evaluate the influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) Technology and demonstrate factors important for this issue.

Design/methodology/approach

Two types of soldering materials and three different assembly procedures were used for assembly of PoP system. The reliability properties of assembled PoP systems were investigated using accelerated aging and periodic resistance measurements of daisy-chain solder joints systems. The purpose of such approach was to determine which soldering material (flux or solder paste) as well as which assembly process parameter (dipping depth of upper component in soldering material), would provide better reliability properties of the solder joints in the PoP system.

Findings

It was stated that both selected flux and solder paste dedicated to assembly of PoP systems can be utilized in soldering of PoP applications. More reliable PoP systems applications require larger attention regarding materials selection and assembly parameters. It is recommended 50 per cent dipping depth of ball’s height into soldering material during upper PoP component assembly for more reliable applications. For less demanding PoP systems, the process window from 30 up to 70 per cent is acceptable. All observed failures after thermal shocks occurred in upper PoP components.

Originality/value

This paper explains how materials and assembly parameters have influence on lead-free solder joints reliability in PoP systems. Especially, influence of process window for dipping procedure of upper components balls into soldering material was presented.

Citation

Sitek, J., Stęplewski, W., Janeczek, K., Kościelski, M., Lipiec, K., Ciszewski, P. and Krzaczek, T. (2015), "Influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) technology", Soldering & Surface Mount Technology, Vol. 27 No. 3, pp. 98-102. https://doi.org/10.1108/SSMT-03-2015-0011