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Non-destructive detection methods for discontinuities of interconnection structures

Tomas Blecha (Faculty of Electrical Engineering, University of West Bohemia, Plzen, Czech Republic)

Microelectronics International

ISSN: 1356-5362

Publication date: 4 January 2016

Abstract

Purpose

The purpose of this paper is to demonstrate the non-destructive methods for detection and localization of interconnection structure discontinuities based on the signal analysis in the frequency and time domain.

Design/methodology/approach

The paper deals with the discontinuity characterization of interconnection structures created on substrates used for electronics, and methods for their detection and localization, based on the frequency analysis of transmitted signals. Used analyses are based on the theoretical approach for the solution of discontinuity electrical parameters and are the base for diagnostic methods of discontinuity identification.

Findings

The measurement results of reflection parameters, frequency spectrums of transmitted signals and characteristic impedance values are presented on test samples containing multiple line cracks and their width reduction.

Practical implications

Obtained results can be used practically, not only for the detection of transmission lines discontinuities on printed circuit boards but also in other applications, such as the quality assessment of bonded joints.

Originality/value

Developed methods allow the quick identification and localization of particular discontinuities without the destruction of tested devices.

Keywords

  • Micro-circuit technology
  • Discontinuity
  • Characteristic impedance
  • Frequency analysis
  • Interconnection structure
  • Standing wave
  • Scattering parameter

Acknowledgements

This research has been supported by the European Regional Development Fund and the Ministry of Education, Youth and Sports of the Czech Republic under the Regional Innovation Centre for Electrical Engineering (RICE), project No. CZ.1.05/2.1.00/03.

Citation

Blecha, T. (2016), "Non-destructive detection methods for discontinuities of interconnection structures", Microelectronics International, Vol. 33 No. 1, pp. 23-35. https://doi.org/10.1108/MI-09-2014-0040

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Emerald Group Publishing Limited

Copyright © 2016, Emerald Group Publishing Limited

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