TY  - JOUR
AB  - Purpose The purpose of this paper is to investigate the nanoscale electric performance of NiO thin films in grain boundary and grain face.Design/methodology/approach PeakForce tunnel atomic force is applied to visualize the nanoscale current imaging of the NiO thin film on fluorine tin oxide substrate.Findings The results show that the grain boundary has a significant impact on the nanoscale current of the NiO film. The electronic conductivity and in grain boundary is higher than that of the NiO film in grain face. The width of the conductive zone in the NiO film over grain boundaries is ∼ 60 nm. The tunnel current between the tip and the NiO film is consistent with the Fowler–Nordheim tunnel model.Originality/value The higher tunnel current in grain boundary is probably attributed to the enhanced energy band bending and adhesion force.
VL  - 36
IS  - 4
SN  - 1356-5362
DO  - 10.1108/MI-02-2019-0008
UR  - https://doi.org/10.1108/MI-02-2019-0008
AU  - Zhang Yidong
PY  - 2019
Y1  - 2019/01/01
TI  - Observation of the enhanced tunnel current of NiO thin films in grain boundary by peakforce TUNA
T2  - Microelectronics International
PB  - Emerald Publishing Limited
SP  - 160
EP  - 164
Y2  - 2024/09/19
ER  -