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Identification methods and indicators of important patents

Hirokazu Yamada (Knowledge and Information Systems Department, Graduate School of Humanities and Sustainable System Sciences, Osaka Prefecture University, Sakai, Osaka, Japan)

Library Hi Tech

ISSN: 0737-8831

Article publication date: 6 September 2021

Issue publication date: 27 May 2022

319

Abstract

Purpose

This study aims to find technologically important patent identification methods and indicators early and efficiently to grasp the technical qualitative level of patents, which are output indicators of research and development (R&D) results.

Design/methodology/approach

This paper reports on two methods for distinguishing important patents and the indicators obtained from those methods. One of the discrimination methods is Heckman's two-step estimation procedure. The second method is to find the centrality of each patent by network analysis of the citation relationship between publications and to find the importance from the magnitude of the centrality value.

Findings

In Heckman's analysis, the number of citations within three years after publication and the applicant's right acquisition/maintenance motivation index had positive effects on patent importance. The discriminative indicators of important patents by network analysis were degree centrality, mediation centrality, proximity centrality and transit values in the aggregated subnetworks. These two analytical methods are in a relationship that can complement each other's shortcomings. To efficiently evaluate the qualitative importance of patents, it is recommended to use these two methods together.

Research limitations/implications

The indicators of important technical patents might change depending on the technical field. Future studies can apply this research to multiple technical fields to improve robustness and to construct an algorithm that can efficiently evaluate the quality of patents.

Practical implications

This study's results can be useful for grasping the patent position of the company or competitors numerically and for quantitatively evaluating the quality of R&D activities. Furthermore, it is possible to streamline the routine for an exploratory search of a huge number of patents. For example, it could be useful for detecting changes in the paradigm of specific technical knowledge, evolving the genealogy of technical knowledge and creating patent maps for new R&D. These methods greatly increase the effectiveness of technical knowledge information, which is the basis of R&D. In addition, the results of this study can help in evaluating patented assets.

Social implications

This study confirmed the development process of technical knowledge. It is a fact that sharing, sympathy and mutual trust for technical issues and technical values are created among professional engineers and researchers inside and outside the organization, and their preferences and interactions develop and expand technical knowledge. Understanding the process of development and the evolution of this technical knowledge gives hints, such as expanding the discretionary power of engineers and researchers regarding corporate secrets, or reviewing the balance between control and independence, to solve Japanese management problems, which are often closed and monetized in R&D activities.

Originality/value

This study presents a scoring of the technical significance of patents by combining the two analytical methods. In addition, there are proposals as a method for detecting changes in the genealogy and paradigm of technical knowledge. As an analysis method, it is a new proposal that has never existed before.

Keywords

Acknowledgements

The author would like to thank Dr. Shinji Watanabe of Osaka Prefecture University for his timely advice and support regarding analytical methods. The author is also grateful to the anonymous referee for their comments, which significantly improved the clarity of this paper. All mistakes herein are, of course, the author's responsibility.

Citation

Yamada, H. (2022), "Identification methods and indicators of important patents", Library Hi Tech, Vol. 40 No. 3, pp. 750-785. https://doi.org/10.1108/LHT-04-2021-0152

Publisher

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Emerald Publishing Limited

Copyright © 2021, Emerald Publishing Limited

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