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Degradation modelling and life expectancy using Markov chain model for carriageway

Kong Fah Tee (Faculty of Engineering and Science, University of Greenwich, Kent, UK)
Ejiroghene Ekpiwhre (Faculty of Engineering and Science, University of Greenwich, Kent, UK)
Zhang Yi (Kyoto University, Kyoto, Japan)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 4 June 2018

336

Abstract

Purpose

Automated condition surveys have been recently introduced for condition assessment of highway infrastructures worldwide. Accurate predictions of the current state, median life (ML) and future state of highway infrastructures are crucial for developing appropriate inspection and maintenance strategies for newly created as well as existing aging highway infrastructures. The paper aims to discuss these issues.

Design/methodology/approach

This paper proposes Markov Chain based deterioration modelling using a linear transition probability (LTP) matrix method and a median life expectancy (MLE) algorithm. The proposed method is applied and evaluated using condition improvement between the two successive inspections from the Surface Condition Assessment of National Network of Roads survey of the UK Pavement Management System.

Findings

The proposed LTP matrix model utilises better insight than the generic or decoupling linear approach used in estimating transition probabilities formulated in the past. The simulated LTP predicted conditions are portrayed in a deterioration profile and a pairwise correlation. The MLs are computed statistically with a cumulative distribution function plot.

Originality/value

The paper concludes that MLE is ideal for projecting half asset life, and the LTP matrix approach presents a feasible approach for new maintenance regime when more certain deterioration data become available.

Keywords

Citation

Tee, K.F., Ekpiwhre, E. and Yi, Z. (2018), "Degradation modelling and life expectancy using Markov chain model for carriageway", International Journal of Quality & Reliability Management, Vol. 35 No. 6, pp. 1268-1288. https://doi.org/10.1108/IJQRM-06-2017-0116

Publisher

:

Emerald Publishing Limited

Copyright © 2018, Emerald Publishing Limited

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