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Modified chain sampling plan for assuring percentile life under Weibull distribution and generalized exponential distribution

Jeyadurga P. (Department of Computer Applications, Kalasalingam Academy of Research and Education, Krishnankoil, India)
Usha Mahalingam (Department of Mathematics, Mepco Schlenk Engineering College, Sivakasi, India)
Saminathan Balamurali (Department of Computer Applications, Kalasalingam University, Krishnankoil, India)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Publication date: 1 October 2018

Abstract

Purpose

The purpose of this paper is to design a modified chain sampling plan for assuring the product percentile life where the lifetime follows Weibull or generalized exponential distributions (GEDs). In order to reduce the cost of inspection when implementing the proposed modified chain sampling plan, it is also considered the economic aspect of designing of proposed plan in this paper.

Design/methodology/approach

The authors have designed the proposed plan on the basis of two points on the operating characteristic (OC) curve approach. The optimization problem is used to determine the plan parameters of the proposed plan so that the specified values of producer’s risk and consumer’s risk are satisfied simultaneously.

Findings

The results we have obtained, confirm that the proposed plan will be very effective in reducing the sample size rather than other existing sampling plans. The OC curves of proposed plan, chain sampling plan and zero acceptance number single sampling plan show that the performance of proposed plan in discriminating the good and poor quality lots is better than other two plans. In this paper, it is proved that the value of number of preceding lots required for current lot disposition plays an important role.

Originality/value

The proposed modified chain sampling plan for assuring the percentile lifetime of the products under Weibull or GEDs is not available in the literature. The proposed plan can be used in all the manufacturing industries to assure the product percentile lifetime with minimum sample size as well as minimum cost.

Keywords

  • Weibull distribution
  • Life testing
  • Generalized exponential distribution
  • Modified chain sampling plan

Acknowledgements

This research was supported by Department of Science and Technology-Science and Engineering Research Board (DST-SERB) of India through the project (SR/S4/MS:790/12). The authors would like to thank the editor and the anonymous reviewers for their positive comments and precious suggestions which significantly improved the presentation of this manuscript.

Citation

P., J., Mahalingam, U. and Balamurali, S. (2018), "Modified chain sampling plan for assuring percentile life under Weibull distribution and generalized exponential distribution", International Journal of Quality & Reliability Management, Vol. 35 No. 9, pp. 1989-2005. https://doi.org/10.1108/IJQRM-02-2018-0044

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Emerald Publishing Limited

Copyright © 2018, Emerald Publishing Limited

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