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Group acceptance sampling plan for resubmitted lots based on life tests for odds exponential log logistic distribution

Rosaiah K. (Department of Statistics, Acharya Nagarjuna University, Guntur, India)
Srinivasa Rao Gadde (Department of Statistics, The University of Dodoma, Dodoma, Tanzania)
Kalyani K. (Department of Statistics, Acharya Nagarjuna University, Guntur, India)
Sivakumar D.C.U. (Department of Statistics, Acharya Nagarjuna University, Guntur, India)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 4 September 2017

195

Abstract

Purpose

The purpose of this paper is to develop a group acceptance sampling plan (GASP) for a resubmitted lot when the lifetime of a product follows odds exponential log logistic distribution introduced by Rao and Rao (2014). The parameters of the proposed plan such as minimum group size and acceptance number are determined for a pre-specified consumer’s risk, number of testers and the test termination time. The authors compare the proposed plan with the ordinary GASP, and the results are illustrated with live data example.

Design/methodology/approach

The parameters of the proposed plan such as minimum group size and acceptance number are determined for a pre-specified consumer’s risk, number of testers and the test termination time.

Findings

The authors determined the group size and acceptance number.

Research limitations/implications

No specific limitations.

Practical implications

This methodology can be applicable in industry to study quality control.

Social implications

This methodology can be applicable in health study.

Originality/value

The parameters of the proposed plan such as minimum group size and acceptance number are determined for a pre-specified consumer’s risk, number of testers and the test termination time.

Keywords

Citation

K., R., Gadde, S.R., K., K. and D.C.U., S. (2017), "Group acceptance sampling plan for resubmitted lots based on life tests for odds exponential log logistic distribution", International Journal of Quality & Reliability Management, Vol. 34 No. 8, pp. 1343-1351. https://doi.org/10.1108/IJQRM-01-2016-0013

Publisher

:

Emerald Publishing Limited

Copyright © 2017, Emerald Publishing Limited

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