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Reducing the number of tests for attribute inspection systems

Assembly Automation

ISSN: 0144-5154

Article publication date: 1 December 1995

Abstract

Examines a way to dramatically reduce the number of tests it takes to qualify a vision inspection system [VIS] which carries out attribute inspections by applying a statistical operation called a binomial distribution. Describes a binomial distribution and looks at its employment in manufacturing terms. Outlines how a conventional inspection system works and compares the two techniques. Concludes that the advantages of using a binomial distribution include a reduced number of tests, a reduction in equipment cost and the technique is simple to understand and perform.

Keywords

Citation

Yaccino, M. and Maynard, J. (1995), "Reducing the number of tests for attribute inspection systems", Assembly Automation, Vol. 15 No. 4, pp. 14-15. https://doi.org/10.1108/EUM0000000004230

Publisher

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MCB UP Ltd

Copyright © 1995, MCB UP Limited