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Analysis, design and experimentation of high-pass negative group delay lumped circuit

Hongyu Du (Nanjing University of Information Science and Technology, Nanjing, China)
Rong Yang (Nanjing University of Information Science and Technology, Nanjing, China)
Taochen Gu (Department of School of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing, China)
Xiang Zhou (Southeast University, Nanjing, China)
Samar Yazdani (Bahria University – Karachi Campus, Karachi, Pakistan)
Eric Sambatra (Institut Supérieur de Technologie, Luxembourg, Luxembourg)
Fayu Wan (Nanjing University of Information Science and Technology, Nanjing, China)
Sébastien Lallechere (Department of Institut Pascal, Universite Clermont Auvergne, Clermont-Ferrand, France)
Blaise Ravelo (Nanjing University of Information Science and Technology, Nanjing, China)

Circuit World

ISSN: 0305-6120

Article publication date: 18 August 2021

Issue publication date: 5 April 2023

84

Abstract

Purpose

The purpose of this paper is to introduce an innovative theoretical, numerical and experimental investigations on the HP NGD function. The identified HP NGD topology under study is constituted by first order passive RC-network. The simulations and measurements confirm in very good agreement the HP NGD behaviors of the tested circuits. NGD responses with optimal values of about -1 ns and cut-off frequencies of about 20 MHz are obtained.

Design/methodology/approach

The identified HP NGD topology understudy is constituted by a first-order passive Resistor-capacitor RC network. An innovative approach to HP NGD analysis is developed. The analytical investigation from the voltage transfer function showing the meaning of HP properties is established.

Findings

This paper introduces innovative theoretical, numerical and experimental investigations on the HP NGD function.

Originality/value

The NGD characterization as a function of the resistance and capacitance parameters is investigated. The feasibility of the HP NGD function is verified with proofs of concept constituted of lumped surface mounted components on printed circuit boards. The simulations and measurements confirm in very good agreement the HP NGD behaviors of the tested circuits. NGD responses with optimal values of about −1 ns and cut-off frequencies of about 20 MHz are obtained.

Keywords

Acknowledgements

This research work was supported in part by the Startup Foundation for Introducing Talent of NUIST, in part by the Postgraduate Research & Practice Innovation Program of Jiangsu Province under Grant (KYCX20_0966, SJCX21_0351).

Citation

Du, H., Yang, R., Gu, T., Zhou, X., Yazdani, S., Sambatra, E., Wan, F., Lallechere, S. and Ravelo, B. (2023), "Analysis, design and experimentation of high-pass negative group delay lumped circuit", Circuit World, Vol. 49 No. 2, pp. 180-191. https://doi.org/10.1108/CW-07-2020-0131

Publisher

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Emerald Publishing Limited

Copyright © 2021, Emerald Publishing Limited

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