Experimental verification of volt-ampere characteristic curve for a memristor-based chaotic circuit

Abstract

Purpose

The ammeter can measure the direct current and low-frequency alternating current through the wires, but it is difficult to measure complex waveforms. The oscilloscope can measure complex waveforms, but it is easy to measure the voltage waveform and difficult to measure the current waveform. Thus, how to measure complex current waveforms with oscilloscope is an important and crucial issue that needs to be solved in practical engineering applications. To solve the above problems, an active short circuit line method is proposed to measure the volt-ampere characteristic curve of chaotic circuits.

Design/methodology/approach

In this paper, an active short circuit line method is proposed to measure the volt-ampere characteristic curve of various chaotic circuits especially for memristive systems. A memristor-based chaotic system is introduced, and the corresponding memristor-based circuit is constructed and implemented by using electronic components.

Findings

The chaotic attractors and volt-ampere characteristic curve of the memristor-based chaotic circuit are successfully analyzed and verified by oscilloscope measurement with the proposed active short circuit line method. Accordingly, the hardware circuit experiments are carried out to validate the effectiveness and feasibility of the active short circuit line method for these chaotic circuits. A good agreement is shown between the numerical simulations and the experimental results.

Originality/value

The primary contributions of this paper are as follows: an active short circuit line method for measuring the volt-ampere characteristic curve of chaotic circuits is proposed for the first time. A memristor-based chaotic system is also constructed by using memristor as nonlinear term. Then, the active short circuit line method is applied to measure the volt-ampere characteristic curve of the corresponding memristor-based chaotic circuit.

Citation

Xiong, L., Zhang, X. and Chen, Y. (2020), "Experimental verification of volt-ampere characteristic curve for a memristor-based chaotic circuit", Circuit World, Vol. 46 No. 1, pp. 13-24. https://doi.org/10.1108/CW-04-2019-0035