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Electrical properties of thin-film resistors in a wide temperature range

Paweł Winiarski (Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wroclaw, Poland)
Adam Kłossowicz (Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wroclaw, Poland)
Jacek Wróblewski (Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wroclaw, Poland)
Andrzej Dziedzic (Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wroclaw, Poland)
Wojciech Stęplewski (Centre for Advanced Technology, Tele and Radio Research Institute, Warsaw, Poland)

Circuit World

ISSN: 0305-6120

Article publication date: 3 August 2015

172

Abstract

Purpose

The purpose of this paper is to characterize electrical properties of nickel-phosphorus (Ni-P) thin-film resistors made on FR-4 laminate in a wide range of temperature (from −180 to 20°C).

Design/methodology/approach

The study was performed using resistors made of Ni-P foil with two different thicknesses (0.1 or 0.05 μm) and sheet resistances (100 or 250 Ω/sq), respectively. The resistance rectangular resistors had length and width from the range between 0.59 and 5.91 mm. The resistance versus temperature characteristics and their distribution as well as resistors ' durability to low-temperature thermal shocks were investigated.

Findings

The results showed almost linear temperature dependence of resistance with a negative temperature coefficient of resistance of about −95 ppm/°C for 250 Ω/sq layer and −55 ppm/°C for 100 Ω/sq layer. A very small dimensional effect was observed for sheet resistance as well as for R(T) characteristic. Thin-film resistors are also characterized by very high durability to low-temperature thermal shocks.

Originality/value

The results presented in this paper can be very useful for low-temperature applications of thin-film resistors made on printed circuit boards. They suggest possibility of wide applications of these components in a wide temperature range.

Keywords

Acknowledgements

This work was supported by the National Science Centre (Poland), Grant DEC-2011/01/B/ST7/06564 and statutory activity of Wroclaw University of Technology.

Citation

Winiarski, P., Kłossowicz, A., Wróblewski, J., Dziedzic, A. and Stęplewski, W. (2015), "Electrical properties of thin-film resistors in a wide temperature range", Circuit World, Vol. 41 No. 3, pp. 116-120. https://doi.org/10.1108/CW-03-2015-0010

Publisher

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Emerald Group Publishing Limited

Copyright © 2015, Emerald Group Publishing Limited

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