Books and journals Case studies Expert Briefings Open Access
Advanced search

Simplified analysis of iron loss in three-phase transformer considering rotating loss

Yang Liu (School of Electrical Engineering, Shenyang University of Technology, Shenyang, China)
Yanli Zhang (School of Electrical Engineering, Shenyang University of Technology, Shenyang, China)
Dexin Xie (School of Electrical Engineering, Shenyang University of Technology, Shenyang, China)
Baodong Bai (School of Electrical Engineering, Shenyang University of Technology, Shenyang, China)

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN: 0332-1649

Publication date: 1 January 2014

Abstract

Purpose

A simplified method for calculating iron loss of three-phase transformer is proposed in this paper. The rotating iron loss measured from 2-D vector magnetic property measurement system of gain-oriented silicon steel sheet can be taken into account in this method. The paper aims to discuss these issues.

Design/methodology/approach

The finite element analysis formulation is combined with the magnetic reluctivity model expressed by diagonal tensor for 2-D nonlinear and anisotropic magnetic problem, while the iron loss is computed in terms of the interpolation of rotational loss curves measured under various loci of controlled magnetic flux density B.

Findings

The iron loss of three-phase transformer is obtained by the proposed method. And the calculating iron loss is verified with experimental results.

Originality/value

The method presented in this paper enables the iron loss of three-phase transformer to be more accurately calculated and more easily applied, considering the rotational iron loss.

Keywords

  • Magnetic hysteresis
  • Transformers

Citation

Liu, Y., Zhang, Y., Xie, D. and Bai, B. (2014), "Simplified analysis of iron loss in three-phase transformer considering rotating loss", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 33 No. 1/2, pp. 74-84. https://doi.org/10.1108/COMPEL-11-2012-0331

Download as .RIS

Publisher

:

Emerald Group Publishing Limited

Copyright © 2014, Emerald Group Publishing Limited

Please note you do not have access to teaching notes

You may be able to access teaching notes by logging in via Shibboleth, Open Athens or with your Emerald account.
Login
If you think you should have access to this content, click the button to contact our support team.
Contact us

To read the full version of this content please select one of the options below

You may be able to access this content by logging in via Shibboleth, Open Athens or with your Emerald account.
Login
To rent this content from Deepdyve, please click the button.
Rent from Deepdyve
If you think you should have access to this content, click the button to contact our support team.
Contact us
Emerald Publishing
  • Opens in new window
  • Opens in new window
  • Opens in new window
  • Opens in new window
© 2021 Emerald Publishing Limited

Services

  • Authors Opens in new window
  • Editors Opens in new window
  • Librarians Opens in new window
  • Researchers Opens in new window
  • Reviewers Opens in new window

About

  • About Emerald Opens in new window
  • Working for Emerald Opens in new window
  • Contact us Opens in new window
  • Publication sitemap

Policies and information

  • Privacy notice
  • Site policies
  • Modern Slavery Act Opens in new window
  • Chair of Trustees governance statement Opens in new window
  • COVID-19 policy Opens in new window
Manage cookies

We’re listening — tell us what you think

  • Something didn’t work…

    Report bugs here

  • All feedback is valuable

    Please share your general feedback

  • Member of Emerald Engage?

    You can join in the discussion by joining the community or logging in here.
    You can also find out more about Emerald Engage.

Join us on our journey

  • Platform update page

    Visit emeraldpublishing.com/platformupdate to discover the latest news and updates

  • Questions & More Information

    Answers to the most commonly asked questions here