To read the full version of this content please select one of the options below:

Continuous local material model for the mechanical stress-dependency of magnetic properties in non-oriented electrical steel

Jan Karthaus (Institute of Electrical Machines (IEM), RWTH Aachen University, Aachen, Germany)
Silas Elfgen (Institute of Electrical Machines (IEM), RWTH Aachen University, Aachen, Germany)
Kay Hameyer (Institute of Electrical Machines (IEM), RWTH Aachen University, Aachen, Germany)

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN: 0332-1649

Article publication date: 24 June 2019

Issue publication date: 14 August 2019

Abstract

Purpose

Magnetic properties of electrical steel are affected by mechanical stress. In electrical machines, influences because of manufacturing and assembling and because of operation cause a mechanical stress distribution inside the steel lamination. The purpose of this study is to analyse the local mechanical stress distribution and its consequences for the magnetic properties which must be considered when designing electrical machines.

Design/methodology/approach

In this paper, an approach for modelling stress-dependent magnetic material properties such as magnetic flux density using a continuous local material model is presented.

Findings

The presented model shows a good approximation to measurement results for mechanical tensile stress up to 100 MPa for the studied material.

Originality/value

The presented model allows a simple determination of model parameters by using stress-dependent magnetic material measurements. The model can also be used to determine a scalar mechanical stress distribution by using a known magnetic flux density distribution.

Keywords

Citation

Karthaus, J., Elfgen, S. and Hameyer, K. (2019), "Continuous local material model for the mechanical stress-dependency of magnetic properties in non-oriented electrical steel", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 38 No. 4, pp. 1075-1084. https://doi.org/10.1108/COMPEL-10-2018-0388

Publisher

:

Emerald Publishing Limited

Copyright © 2019, Emerald Publishing Limited