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Extended Kalman filter-based state estimation of MOSFET circuit

Rahul Bansal (Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, India)
Sudipta Majumdar (Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, India)

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN: 0332-1649

Article publication date: 16 May 2019

Issue publication date: 15 November 2019

149

Abstract

Purpose

This paper aims to present the estimation of the output voltage of metal oxide semiconductor field effect transistor (MOSFET) using the extended Kalman filter (EKF) method.

Design/methodology/approach

The method uses EKF for MOSFET output voltage estimation. To implement the EKF method, the state space model has been obtained using Kirchhoff’s current law and Enz-Krummenacher-Vittoz model of the MOSFET circuit.

Findings

The proposed method can be used for any mode of MOSFET operation besides near the quiescent point region. The nonlinearity that occurs in the saturation region of MOSFET can also be considered in the proposed method. The proposed method can also be used for a large input signal. Though Kalman filter can be used for the small amplitude input signal, it results in inaccurate estimation due to the linearization of the nonlinear system.

Research limitations/implications

The method is able to track the parameters when they are slowly changing with time.

Originality/value

The proposed method presents maximal precision of simulation as the maximal precision of simulation requires modeling of the circuit in terms of device parameters and circuit elements.

Keywords

Acknowledgements

Funding: Council for Scientific and Industrial Research, India x 08/133(0011)2014/EMR-1.

Citation

Bansal, R. and Majumdar, S. (2019), "Extended Kalman filter-based state estimation of MOSFET circuit", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 38 No. 6, pp. 1885-1903. https://doi.org/10.1108/COMPEL-09-2018-0367

Publisher

:

Emerald Publishing Limited

Copyright © 2019, Emerald Publishing Limited

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