Simulation and empirical validation of new sensitivity based reliability analysis technique for processors deployed in industrial drives
ISSN: 0332-1649
Article publication date: 5 October 2022
Issue publication date: 20 January 2023
Abstract
Purpose
The purpose of this study is to extend a sensitivity-based reliability technique for the processors deployed in industrial drive (ID).
Design/methodology/approach
The processor provides flexible operation, re-configurability, and adaptable compatibility in industrial motor drive system. A sensitivity-based model allows a robust tool for validating the system design. Sensitivity is the probability of a partial failure rate for a distributed variable; sensitivity and failure rates are also complementary. Conversely, traditional power electronic components reliability estimating standards have overlooked it, and it is essential to update them to account for the sensitivity parameter. A new sensitivity-based reliability prediction methodology for a typical 32-bit microprocessor operating at 30ºC deployed in ID is presented to fill this gap. The proposed techniques are compared with the estimated processor reliability values obtained from various reliability standards using the validated advanced logistics development tool. The main contribution of this work is to provide a sensitivity extended reliability method over the conventional method directing toward improving reliability, availability, and maintainability in the design of ID.
Findings
The analysis shows that the sensitivity of the processor’s circuit increases due to increases in complexity of the system by reducing the overall mean time between failure upon comparing among conventional reliability standards.
Originality/value
The significance of this paper lies in the overall, sensitivity-based reliability technique for processors in comparison to the traditional reliability complexity in IDs.
Keywords
Acknowledgements
The authors would like to express their sincere gratitude to Vellore Institute of Technology, Vellore for the financial support offered by them through VIT seed grant “SG20210104” to carry out this research successfully.
Citation
Rao N.S., R. and A., C. (2023), "Simulation and empirical validation of new sensitivity based reliability analysis technique for processors deployed in industrial drives", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 42 No. 2, pp. 585-604. https://doi.org/10.1108/COMPEL-01-2022-0054
Publisher
:Emerald Publishing Limited
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