Fast and accurate detection of surface defect based on improved YOLOv4
Article publication date: 2 December 2021
Issue publication date: 11 January 2022
The current popular image processing technologies based on convolutional neural network have the characteristics of large computation, high storage cost and low accuracy for tiny defect detection, which is contrary to the high real-time and accuracy, limited computing resources and storage required by industrial applications. Therefore, an improved YOLOv4 named as YOLOv4-Defect is proposed aim to solve the above problems.
On the one hand, this study performs multi-dimensional compression processing on the feature extraction network of YOLOv4 to simplify the model and improve the feature extraction ability of the model through knowledge distillation. On the other hand, a prediction scale with more detailed receptive field is added to optimize the model structure, which can improve the detection performance for tiny defects.
The effectiveness of the method is verified by public data sets NEU-CLS and DAGM 2007, and the steel ingot data set collected in the actual industrial field. The experimental results demonstrated that the proposed YOLOv4-Defect method can greatly improve the recognition efficiency and accuracy and reduce the size and computation consumption of the model.
This paper proposed an improved YOLOv4 named as YOLOv4-Defect for the detection of surface defect, which is conducive to application in various industrial scenarios with limited storage and computing resources, and meets the requirements of high real-time and precision.
The authors would like to thank NEU and DAGM for collecting and labeling the data. Funding: This research is supported by the project of digital twin system and its application demonstration for automotive welding and casting lines, D5130200104.
Lian, J., He, J., Niu, Y. and Wang, T. (2022), "Fast and accurate detection of surface defect based on improved YOLOv4", Assembly Automation, Vol. 42 No. 1, pp. 134-146. https://doi.org/10.1108/AA-04-2021-0044
Emerald Publishing Limited
Copyright © 2020, Emerald Publishing Limited