The Application of Machine Vision to IC Surface Inspection
Abstract
During IC inspection, which includes the two parts of Mark and Lead, the deviation of IC on the tape occurring in high speed movements usually generates light reflection effect, which in turn causes errors in IC recognition as measured by machine vision system. this research filters the light reflection effect by developing standard components, identifies the correct position of IC Lead, hence fixes the measurement errors or non‐measurability caused by light reflection, avoids the resulting discontinued operation of measuring system, and improves the productivity.
Keywords
Citation
Chung, Y., Tsai, C. and Lin, Y. (2003), "The Application of Machine Vision to IC Surface Inspection", Asian Journal on Quality, Vol. 4 No. 2, pp. 50-64. https://doi.org/10.1108/15982688200300019
Publisher
:MCB UP Ltd
Copyright © 2003, MCB UP Limited