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Bayes test plan for steady state availability of parallel system

Maroof A. Khan (Department of Community Medicine, MLN Medical College, Allahabad, India)
H.M. Islam (Department of Statistics and Operations Research, Aligarh Muslim University, Aligarh, India)

Asian Journal on Quality

ISSN: 1598-2688

Article publication date: 21 June 2011

156

Abstract

Purpose

The purpose of this paper is to analyze the Bayes acceptance plan of the parallel system for pre‐specified consumer's and producer's specifications regarding the system availability.

Design/methodology/approach

This study considers Bayesian technique to examine the acceptance plan for steady state availability of a parallel system for half‐normal failure as well as repair time.

Findings

If there is variation(s) in mean availability of the test plan, then according to their admissible risks producer and consumer may choose a suitable plan.

Originality/value

The methodology proposed in the paper represents Bayes acceptance plan for testing the lots of the parallel system model when failure and repair time follows half‐normal distribution.

Keywords

Citation

Khan, M.A. and Islam, H.M. (2011), "Bayes test plan for steady state availability of parallel system", Asian Journal on Quality, Vol. 12 No. 1, pp. 30-34. https://doi.org/10.1108/15982681111160910

Publisher

:

Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited

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