Bayes test plan for steady state availability of parallel system
Abstract
Purpose
The purpose of this paper is to analyze the Bayes acceptance plan of the parallel system for pre‐specified consumer's and producer's specifications regarding the system availability.
Design/methodology/approach
This study considers Bayesian technique to examine the acceptance plan for steady state availability of a parallel system for half‐normal failure as well as repair time.
Findings
If there is variation(s) in mean availability of the test plan, then according to their admissible risks producer and consumer may choose a suitable plan.
Originality/value
The methodology proposed in the paper represents Bayes acceptance plan for testing the lots of the parallel system model when failure and repair time follows half‐normal distribution.
Keywords
Citation
Khan, M.A. and Islam, H.M. (2011), "Bayes test plan for steady state availability of parallel system", Asian Journal on Quality, Vol. 12 No. 1, pp. 30-34. https://doi.org/10.1108/15982681111160910
Publisher
:Emerald Group Publishing Limited
Copyright © 2011, Emerald Group Publishing Limited