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Analysis of packaging and sealing techniques for microelectronic modules and recent advances

P.K. Khanna (Central Electronics Engineering Research Institute, Pilani (Rajasthan), India)
S.K. Bhatnagar (Central Electronics Engineering Research Institute, Pilani (Rajasthan), India)
W. Gust (Institut für Metallkunde, University of Stuttgart, Germany)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 August 1999

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Abstract

A critical analysis of packaging and sealing methods for integrated circuits, hybrid microcircuits and multichip modules has been done. The best hermetic and high yield weld seal is examined along with other conventional seals like solder seal, frit seal and plastic seal with special emphasis on materials and processes involved in each case. An overview of emerging technology is also presented. A comparative analysis is made for selection of the right technology and material for a particular requirement.

Keywords

Citation

Khanna, P.K., Bhatnagar, S.K. and Gust, W. (1999), "Analysis of packaging and sealing techniques for microelectronic modules and recent advances", Microelectronics International, Vol. 16 No. 2, pp. 8-12. https://doi.org/10.1108/13565369910268187

Publisher

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MCB UP Ltd

Copyright © 1999, MCB UP Limited

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