Microwave permittivity and permeability of Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ thick films using superstrate method

Abstract

Purpose

The purpose of this paper is to study thickness dependent variation in microwave properties of the Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ (x=0.8, 0.9) thick films and enhancement of power efficiency of Ag thick film EMC patch antenna.

Design/methodology/approach

X‐band microwave properties of the Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ (x=0.8, 0.9) thick films were measured by superstrate technique using Ag thick film EMC patch antenna as the resonant element. The complex permittivity and permeability of these thick films were also measured by this technique. The microwave response of the EMC patch, complex permeability and permittivity of Mg_0.8Mn_0.1Al_0.1Zn_0.8Fe_1.2O₄ and Mg_0.9Al_0.1Zn_0.8Fe_1.2O₄ thick films and their thickness dependency were investigated.

Findings

The XRD patterns reveal the cubic spinel crystal system was obtained for both compositions. The crystallite size obtained was 134.68 nm for Mg_0.8Mn_0.1Al_0.1Zn_0.8Fe_1.2O₄ and 155.99 nm for Mg_0.9Al_0.1Zn_0.8Fe_1.2O₄ The superstrate technique has been used successfully to evaluate the complex permittivity and permeability of the ferrite thick films in the X band. The EMC patch also show thickness and composition dependent frequency agility and enhancement of power efficiency.

Originality/value

The complex permeability of Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ (x=0.8, 0.9) thick films measured by superstrate technique is reported in this paper. The superstrate of Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ (x=0.8, 0.9) thick films makes the Ag thick film EMC patch antenna frequency agile and power amplification is obtained.

Citation

Kashid, P.B., Kulkarni, D.C., Surve, V.G. and Puri, V. (2013), "Microwave permittivity and permeability of Mg_xMn_(0.9−x)Al_0.1Zn_0.8Fe_1.2O₄ thick films using superstrate method", Microelectronics International, Vol. 30 No. 1, pp. 40-46. https://doi.org/10.1108/13565361311298222