TY  - JOUR
AB  - Purpose– The purpose of this paper is to demonstrate the I‐V characteristics of ZnO film on Si substrates with Ag buffer layer by conductive atomic force (C‐AFM).Design/methodology/approach– An Ag buffer layer and Zn film was first deposited on silicon substrate by RF‐sputtering deposition method from high pure Ag and Zn target, respectively. Then, the deposited film was sintered in air at 500°C for 1 h.Findings– The structures and morphologies of the prepared films were characterized by X‐ray diffraction (XRD), energy dispersive spectrum (EDS), atomic force microscopy (AFM), and C‐AFM. The results show that the prepared ZnO films with Ag buffer layer have a good crystallinity and surface morphology. Interestingly, the I‐V curve of ZnO film exhibited typical characteristics of semi‐conductive oxide under the conductive Ag buffer layer.Originality/value– The paper demonstrates, by C‐AFM, that the ZnO/Ag‐buffer/Si exhibits excellent crystal structure, morphology and typical I‐V characteristics.
VL  - 29
IS  - 1
SN  - 1356-5362
DO  - 10.1108/13565361211219149
UR  - https://doi.org/10.1108/13565361211219149
AU  - Zhang Yidong
AU  - He Weiwei
PY  - 2012
Y1  - 2012/01/01
TI  - Study of I‐V characteristics of ZnO film on Si substrate with Ag buffer layer by C‐AFM
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
SP  - 35
EP  - 39
Y2  - 2024/04/25
ER  -