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Stabilization network optimization of internally matched GaN HEMTs

W.J. Luo (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)
X.J. Chen (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)
C.Y. Yang (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)
Y.K. Zheng (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)
K. Wei (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)
X.Y. Liu (Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China)

Microelectronics International

ISSN: 1356-5362

Article publication date: 10 May 2011

177

Abstract

Purpose

The purpose of this paper is to report on the stabilization network optimization of internally matched GaN high electron mobility transistors (HEMTs).

Design/methodology/approach

The effects of the two stabilization networks on the characteristics of the device are discussed, such as the stability, power gain and output power.

Findings

With the optimized stabilization network, the internally matched GaN HEMTs with 16‐mm gate width exhibited good stability and delivers a 46 dBm output power with 6.1 dB power gain under the continuous wave condition at 8 GHz. By using the optimized stabilization network, the package process of the large‐scale microwave power device of GaN HEMTs can be simplified.

Originality/value

This paper provides useful information for the internally matched GaN HEMTs.

Keywords

Citation

Luo, W.J., Chen, X.J., Yang, C.Y., Zheng, Y.K., Wei, K. and Liu, X.Y. (2011), "Stabilization network optimization of internally matched GaN HEMTs", Microelectronics International, Vol. 28 No. 2, pp. 34-37. https://doi.org/10.1108/13565361111127331

Publisher

:

Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited

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