TY  - JOUR
AB  - This paper deals with the investigations carried out on the variation of current noise (1/f noise) in polymer thick film resistors, when they are subjected to pulse voltage trimming. The current noise is measured in terms of noise index (micro volts of noise per volt of DC applied, in a decade of frequency) using Noise Meter Model 315 C manufactured by Quan‐Tech of New Jersey. It has been found that current noise decreases as the resistors are trimmed to lower values. An attempt has been made to explain the decrease in current noise with the trimming of resistors.
VL  - 20
IS  - 3
SN  - 1356-5362
DO  - 10.1108/13565360310487891
UR  - https://doi.org/10.1108/13565360310487891
AU  - Srinivasa Rao Y.
AU  - Satyam M.
PY  - 2003
Y1  - 2003/01/01
TI  - The effect of pulse voltage trimming on current noise of polymer thick film resistors
T2  - Microelectronics International
PB  - MCB UP Ltd
SP  - 7
EP  - 10
Y2  - 2024/04/19
ER  -