This paper deals with the investigations carried out on the variation of current noise (1/f noise) in polymer thick film resistors, when they are subjected to pulse voltage trimming. The current noise is measured in terms of noise index (micro volts of noise per volt of DC applied, in a decade of frequency) using Noise Meter Model 315 C manufactured by Quan‐Tech of New Jersey. It has been found that current noise decreases as the resistors are trimmed to lower values. An attempt has been made to explain the decrease in current noise with the trimming of resistors.
Srinivasa Rao, Y. and Satyam, M. (2003), "The effect of pulse voltage trimming on current noise of polymer thick film resistors", Microelectronics International, Vol. 20 No. 3, pp. 7-10. https://doi.org/10.1108/13565360310487891Download as .RIS
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