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Electrical characterisation of BGA package for RF applications

Arun Chandrasekhar (Alcatel Microelectronics, Westerring 15, 9700, Oudenaarde, Belgium)
Eric Beyne (Alcatel Microelectronics, Westerring 15, 9700, Oudenaarde, Belgium)
Walter De Raedt (Alcatel Microelectronics, Westerring 15, 9700, Oudenaarde, Belgium)
Bart Nauwelaers (Alcatel Microelectronics, Westerring 15, 9700, Oudenaarde, Belgium)
Tania Van Bever (Alcatel Microelectronics, Westerring 15, 9700, Oudenaarde, Belgium)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 August 2002

274

Abstract

This paper highlights the electrical behaviour of the interconnects on a 120‐pin Ball Grid Array (BGA) package from 500 MHz upto 8 GHz. The measurements are made using IMEC's MCM‐D thin film technology as the substrate and with a test set‐up called MoPoM (MCM‐on‐Package‐on‐MCM). The interconnects are classified based on length and measured with adjacent interconnects grounded as well as floating. Circuit models are extracted from the measurement and the simulation respectively for an RF interconnect including the wirebond. Comparison of the circuit models with each other and with the measurement show agreement atleast upto 6 GHz. One of the interconnects is also measured before and after globtopping and a considerable change in the impedance match is observed. The effect of package loading is found to be negligible.

Keywords

Citation

Chandrasekhar, A., Beyne, E., De Raedt, W., Nauwelaers, B. and Van Bever, T. (2002), "Electrical characterisation of BGA package for RF applications", Microelectronics International, Vol. 19 No. 2, pp. 13-18. https://doi.org/10.1108/13565360210427843

Publisher

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MCB UP Ltd

Copyright © 2002, MCB UP Limited

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