Observations on the characteristics of thick film k33 strain sensors fabricated on steel substratesThis paper is based on a poster presentation made at the IMAPS 2001 Symposium, Baltimore.
Article publication date: 1 April 2002
Results are presented from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of printed layers, firing regimes and geometry of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (k33). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that can help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation.
Zheng, Y., Atkinson, J., Zhang, Z. and Sion, R. (2002), "Observations on the characteristics of thick film k33 strain sensors fabricated on steel substratesThis paper is based on a poster presentation made at the IMAPS 2001 Symposium, Baltimore.", Microelectronics International, Vol. 19 No. 1, pp. 33-37. https://doi.org/10.1108/13565360210417772
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