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Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors

J.K. Atkinson (School of Engineering Science, University of Southampton, Southampton, UK)
R.P. Sion (School of Engineering Science, University of Southampton, Southampton, UK)
Z. Zhang (School of Engineering Science, University of Southampton, Southampton, UK)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 April 2001

534

Abstract

An experimental study of thick film strain sensitive resistors as typically employed in resistive bridge interface circuits has been undertaken. It has been found that the chosen aspect ratio (length to width ratio) of these screen printed and fired thick film resistors has a significant effect on both the temperature coefficient of resistance and the low frequency noise characteristics of the devices. This sensitivity to aspect ratio has been attributed to metal end contact migration in the devices during firing and hence a relationship between the sensitivity and the choice of end contact material and the firing regime employed in device fabrication has also been identified.

Keywords

Citation

Atkinson, J.K., Sion, R.P. and Zhang, Z. (2001), "Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors", Microelectronics International, Vol. 18 No. 1, pp. 40-43. https://doi.org/10.1108/13565360110380107

Publisher

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MCB UP Ltd

Copyright © 2001, MCB UP Limited

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