The most commonly used solder for electrical interconnects in electronic packages is the near eutectic 60Sn‐40Pb alloy. This alloy has a number of processing advantages(suitable melting point of 183°C and good wetting behaviour). However, under conditions of cyclic strain and temperature (thermomechanical fatigue) the microstructure of this alloy undergoes a heterogeneous coarsening and failure process that makes the prediction of solder joint lifetime complex. A finite element simulation methodology to predict solder joint mechanical behaviour, that includes microstructural evolution, has been developed. The mechanical constitutive behaviour was incorporated into the time‐dependent internal state variable viscoplastic model through experimental creep tests. The microstructural evolution is incorporated through a series of mathematical relations that describe mass flow in a temperature/strain environment. The model has been found to simulate observed thermomechanical fatigue behaviour in solder joints.
Frear, D., Burchett, S., Neilsen, M. and Stephens, J. (1997), "Microstructurally Based Finite Element Simulation on Solder Joint Behaviour*", Soldering & Surface Mount Technology, Vol. 9 No. 1, pp. 39-42. https://doi.org/10.1108/09540919710800601Download as .RIS
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