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The effect of curing on the performance of ACF bonded chip‐on‐flex assemblies after thermal ageing

M.J. Rizvi (Department of Electronic Engineering, City University of Hong Kong, Kowloon, Hong Kong, People's Republic of China School of Computing and Mathematical Sciences, University of Greenwich, London, UK)
Y.C. Chan (Department of Electronic Engineering, City University of Hong Kong, Kowloon, Hong Kong, People's Republic of China)
C. Bailey (School of Computing and Mathematical Sciences, University of Greenwich, London, UK)
H. Lu (School of Computing and Mathematical Sciences, University of Greenwich, London, UK)
A. Sharif (Department of Electronic Engineering, City University of Hong Kong, Kowloon, Hong Kong, People's Republic of China)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 1 June 2005

901

Abstract

Purpose

Anisotropic conductive film (ACF) is now an attractive technology for direct mounting of chips onto the substrate as an alternative to lead‐free solders. However, despite its various advantages over other technologies, it also has many unresolved reliability issues. For instance, the performance of ACF assembly in high temperature applications is questionable. The purpose of this paper is to study the effect of bonding temperatures on the curing of ACFs, and their mechanical and electrical performance after high temperature ageing.

Design/methodology/approach

In the work presented in this paper, the curing degree of an ACF at different bonding temperatures was measured using a differential scanning calorimeter. The adhesion strength and the contact resistance of ACF bonded chip‐on‐flex assembly were measured before and after thermal ageing and the results were correlated with the curing degree of ACF. The ACF was an epoxy‐based adhesive in which Au‐Ni coated polymer particles were randomly dispersed.

Findings

The results showed that higher bonding temperatures had resulted in better ACF curing and stronger adhesion. After ageing, the adhesion strength increased for the samples bonded at lower temperatures and decreased for the samples bonded at higher temperatures. ACF assemblies with higher degrees of curing showed smaller increases in contact resistance after ageing. Conduction gaps at the bump‐particle and/or particle‐pad interfaces were found with the help of scanning electron microscopy and are thought to be the root cause of the increase in contact resistance.

Originality/value

The present study focuses on the effect of bonding temperatures on the curing of ACFs, and their adhesion strength and electrical performances after high temperature ageing. The results of this study may help the development of ACFs with higher heat resistance, so that ACFs can be considered as an alternative to lead‐free solders.

Keywords

Citation

Rizvi, M.J., Chan, Y.C., Bailey, C., Lu, H. and Sharif, A. (2005), "The effect of curing on the performance of ACF bonded chip‐on‐flex assemblies after thermal ageing", Soldering & Surface Mount Technology, Vol. 17 No. 2, pp. 40-48. https://doi.org/10.1108/09540910510597492

Publisher

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Emerald Group Publishing Limited

Copyright © 2005, Emerald Group Publishing Limited

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