Electron microscopy pictures, mathematical model and approximate solution of the surface potential

Abstract

Purpose

The purpose of this paper is to compare a picture obtained by means of electron microscopy, resulting from the interaction of an electron beam with the material surface, and the numerical mapping of the material surface potentials. This new method has been successfully applied to a composite material and will be checked to describe other complex materials.

Design/methodology/approach

This surface potential function is calculated by a numerical approximation of Laplace's equation with three variables reduced to two variables by using the continuity assumptions on the potential.

Findings

The results are particularly satisfactory and allow future developments in electron microscopy picture analysis to be forecasted.

Originality/value

This paper demonstrates new approximated operator of the surface potential with good accordance between experimental and calculated values.

Citation

Gagnadre, C., Caron, A., Guézénoc, H. and Grohens, Y. (2009), "Electron microscopy pictures, mathematical model and approximate solution of the surface potential", Kybernetes, Vol. 38 No. 5, pp. 780-788. https://doi.org/10.1108/03684920910962669