The purpose of this paper is to put forward a method which uses a computer to make a large number of simulated tests and determine the reference value of a system reliability index according to a unit reliability index.
At the beginning of conducting an index demonstration and development on a new system, its unit reliability index can already reflect the unit reliability level accurately. Based on this characteristic, this index is used as the confidence lower limit of single side estimated in the unit reliability interval to find the failure distribution law of the unit. On this basis, a great number of simulated tests are made by a computer to calculate the unit failure number and reliability point estimated value every test.
The confidence lower limit of single side estimated in the system reliability interval is found by counting up the simulated test data of these units.
Availability of data is the main limitation regarding which model will be applied.
A useful advice for system reliability analysis and calculation.
This paper presents a new approach of system reliability analysis.
Liu, D., Zheng, B. and Yan, P. (2009), "A computational method of system reliability of a successful product based on a simulated test", Kybernetes, Vol. 38 No. 3/4, pp. 362-368. https://doi.org/10.1108/03684920910944056Download as .RIS
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