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Evaluating ground fault current distribution on overhead transmission lines using an iterative nodal analysis

Jun Zou (State Key Laboratory of Control and Simulation of Power Systems and Generation Equipments, Department of Electrical Engineering, Tsinghua University, Beijing, China)
Jae‐bok Lee (Electrical Environment Group, Korea Electrotechnology Research Institute, Changwon, Korea)
JunJie Li (State Key Laboratory of Control and Simulation of Power Systems and Generation Equipments, Department of Electrical Engineering, Tsinghua University, Beijing, China)
Sughun Chang (Electrical Environment Group, Korea Electrotechnology Research Institute, Changwon, Korea)

Abstract

Purpose

The purpose of this paper is to present an original iterative nodal approach to calculate the fault current distribution on overhead lines.

Design/methodology/approach

By changing the mutual couplings among different conductors into the equivalent voltage sources, node voltages are updated iteratively by using conventional nodal analysis with those additional sources until the convergence is achieved.

Findings

The proposed algorithm can handle the complicated topology of a power transmission line and has no difficulties in taking all physical couplings into account. The fault current distribution calculated by this method is in good agreement with those published in the literature. Although the proposed approach is iterative, the CPU time needed is still reasonable compared to the direct solution approach. The memory requirement is low because the coefficient matrix is highly sparse for the nodal analysis of each iteration loop.

Originality/value

The proposed approach can serve as an alternative in calculating the fault current because of its efficiency and ease of implementation.

Keywords

Citation

Zou, J., Lee, J., Li, J. and Chang, S. (2011), "Evaluating ground fault current distribution on overhead transmission lines using an iterative nodal analysis", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 30 No. 2, pp. 622-640. https://doi.org/10.1108/03321641111101113

Publisher

:

Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited

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