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SVM‐based method for high‐impedance faults detection in distribution networks

M. Sarlak (Electrical Engineering Department, Center of Excellence for Power Systems Automation and Operation, Iran University of Science and Technology, Tehran, Islamic Republic of Iran)
S.M. Shahrtash (Electrical Engineering Department, Center of Excellence for Power Systems Automation and Operation, Iran University of Science and Technology, Tehran, Islamic Republic of Iran)

Abstract

Purpose

The purpose of this paper is to present a new pattern recognition‐based algorithm to detect high‐impedance faults (HIFs), including only with broken conductor and arcs, in distribution networks.

Design/methodology/approach

In the proposed method, using discrete wavelet transform, the time‐frequency‐based features of the current waveform are calculated. Then, to extract the best feature set of the generated time‐frequency features, principle components analysis (PCA) is applied and finally support vector machines (SVM) is used as a classifier to distinguish between the HIFs, including only with broken conductor and arcs, and other similar phenomena such as capacitor banks switching, no load transformer switching, load switching, insulator leakage current and harmonic loads.

Findings

The experimental results have shown that using SVM with PCA as the feature extraction method and radial basis function (RBF) as the kernel function has acceptable security and dependability performances in distinguishing HIFs, including only with broken conductor and arcs, from other similar phenomena and is superior to the Bayes and multi‐layer perceptron neural network classifiers.

Originality/value

Using new combination of time‐frequency‐based features with SVM provides a new algorithm to detect HIFs, including only with broken conductor and arcs, that has acceptable security and dependability.

Keywords

Citation

Sarlak, M. and Shahrtash, S.M. (2011), "SVM‐based method for high‐impedance faults detection in distribution networks", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 30 No. 2, pp. 431-450. https://doi.org/10.1108/03321641111101014

Publisher

:

Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited

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