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Probabilistic methods applied to 2D electromagnetic numerical dosimetry

D. Voyer (Laboratoire Ampère, CNRS, Ecole Centrale de Lyon, France)
F. Musy (Institut Camille Jordan, CNRS, Ecole Centrale de Lyon, France)
L. Nicolas (Laboratoire Ampère, CNRS, Ecole Centrale de Lyon, France)
R. Perrussel (Laboratoire Ampère, CNRS, Ecole Centrale de Lyon, France)

Abstract

Purpose

The aim is to apply probabilistic approaches to electromagnetic numerical dosimetry problems in order to take into account the variability of the input parameters.

Design/methodology/approach

A classic finite element method is coupled with probabilistic methods. These probabilistic methods are based on the expansion of the random parameters in two different ways: a spectral expansion and a nodal expansion.

Findings

The computation of the mean and the variance on a simple scattering problem shows that only a few hundreds calculations are required when applying these methods while the Monte Carlo method uses several thousands of samples in order to obtain a comparable accuracy.

Originality/value

The number of calculations is reduced using several techniques: a regression technique, sparse grids computed from Smolyak algorithm or a suited coordinate system.

Keywords

Citation

Voyer, D., Musy, F., Nicolas, L. and Perrussel, R. (2008), "Probabilistic methods applied to 2D electromagnetic numerical dosimetry", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 27 No. 3, pp. 651-667. https://doi.org/10.1108/03321640810861098

Publisher

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Emerald Group Publishing Limited

Copyright © 2008, Emerald Group Publishing Limited