Full‐vectorial finite element solution to open waveguide problems using adaptive perfectly matched layers

M.S. Al Salameh (Department of Electrical Engineering, Jordan University of Science and Technology, Irbid, Jordan)
S.M. Makki (Department of Electrical Engineering, Jordan University of Science and Technology, Irbid, Jordan)

Abstract

Purpose

To provide an efficient numerical eigenvalue solution for open waveguides with lossy anisotropic materials.

Design/methodology/approach

Vector edge elements are used to represent the core of the problem, and an adaptive perfectly matched layer (PML) is used to truncate the surrounding region. The parameters of the PML are allowed to change at each frequency to obtain accurate results using small number of unknowns.

Findings

The method is able to solve many configurations, and considerable reduction in mesh size has been reported. In addition, by adapting the solution according to some error criterion, it will be possible to minimize the dependence on human experience and rely more on automated algorithms.

Research limitations/implications

There is a need to improve the performance of the adaptive algorithm by building an automatic adaptive procedure that can work without human intervention.

Practical implications

A systematic full‐wave algorithm for solving practical electromagnetic engineering problems associated with open waveguides, such as planar transmission lines and optical waveguides, using relatively small computer resources.

Originality/value

Proposed a new “dimension” of adaptation for PML, besides the classical h‐/p‐/hp adaptation methods available in literature. Thus, the requirement for smaller computer resources makes this method cost‐effective for industry in the design of practical open waveguides.

Keywords

Citation

Al Salameh, M. and Makki, S. (2005), "Full‐vectorial finite element solution to open waveguide problems using adaptive perfectly matched layers", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 24 No. 4, pp. 1213-1229. https://doi.org/10.1108/03321640510615562

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Publisher

:

Emerald Group Publishing Limited

Copyright © 2005, Emerald Group Publishing Limited

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